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Simon Josef Thür
Semiconductors_Summary
Commits
ef921b2a
Verified
Commit
ef921b2a
authored
1 year ago
by
Simon Josef Thür
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sum more fixes
parent
bdf883f0
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2 changed files
03_pn_junction_basics.tex
+6
-2
6 additions, 2 deletions
03_pn_junction_basics.tex
05_pn_junction_bias.tex
+7
-7
7 additions, 7 deletions
05_pn_junction_bias.tex
with
13 additions
and
9 deletions
03_pn_junction_basics.tex
+
6
−
2
View file @
ef921b2a
...
...
@@ -67,8 +67,12 @@ And by extension
Rearranging the above, we find an expression for the potential:
\begin{align}
\phi
&
=
\frac
{
kT
}{
q
}
\ln\frac
{
n
}{
n
_
i
}
\label
{
label:eq:boltzman:phi
_
n
}
\\
\phi
&
= -
\frac
{
kT
}{
q
}
\ln\frac
{
p
}{
n
_
i
}
\label
{
label:eq:boltzman:phi
_
p
}
\phi
_
n
&
=
\frac
{
kT
}{
q
}
\ln\frac
{
n
}{
n
_
i
}
\label
{
label:eq:boltzman:phi
_
n
}
\\
\phi
_
p
&
= -
\frac
{
kT
}{
q
}
\ln\frac
{
p
}{
n
_
i
}
\label
{
label:eq:boltzman:phi
_
p
}
\\
\begin{split}
\phi
_
B
&
=
\phi
_
n-
\phi
_
p
\\
&
=
\frac
{
kT
}{
q
}
\ln\frac
{
N
_
A N
_
D
}{
n
_
i
^
2
}
\end{split}
\label
{
label:eq:boltzman:phi
_
B
}
\end{align}
For Si at room temperature this is an increase of 60 mV per decade in doping.
\begin{equation}
...
...
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Click to expand it.
05_pn_junction_bias.tex
+
7
−
7
View file @
ef921b2a
...
...
@@ -32,17 +32,17 @@ Importantly, the SCR resistance ist the most important one and others can be neg
\subsection
{
Space charge region (SCR)
}
In essence, applying a forward/reverse bias effects the depletion region:
\begin{align}
\phi
_
B
&
\rightarrow
\phi
_
B-V
_{
pn
}
\\
x
_
n(V)
&
=
\sqrt
{
\frac
{
2
\varepsilon
(
\phi
_
B-V)N
_
a
}{
q(N
_
a+N
_
d)N
_
d
}}
\\
x
_
p(V)
&
=
\sqrt
{
\frac
{
2
\varepsilon
(
\phi
_
B-V)N
_
d
}{
q(N
_
a+N
_
d)N
_
a
}}
\\
x
_
d(V)
&
=
\sqrt
{
\frac
{
2
\varepsilon
(
\phi
_
B-V)N
_
dN
_
a
}{
q
(
N
_
a+N
_
d)
}}
\\
\left
|E(V)
\right
|
&
=
\sqrt
{
\frac
{
2q(
\phi
_
B-V)
(
N
_
aN
_
d
)
}{
\varepsilon
(N
_
a
+
N
_
d)
}}
\phi
_
B
&
\rightarrow
\phi
_
B-V
_{
pn
}
\\
x
_
n(V)
&
=
\sqrt
{
\frac
{
2
\varepsilon
(
\phi
_
B-V)N
_
a
}{
q(N
_
a+N
_
d)N
_
d
}}
\\
x
_
p(V)
&
=
\sqrt
{
\frac
{
2
\varepsilon
(
\phi
_
B-V)N
_
d
}{
q(N
_
a+N
_
d)N
_
a
}}
\\
x
_
d(V)
&
=
\sqrt
{
\frac
{
2
\varepsilon
(
\phi
_
B-V)
(
N
_
a+N
_
d)
}{
q
N
_
d N
_
a
}}
\\
\left
|E(V)
\right
|
&
=
\sqrt
{
\frac
{
2q(
\phi
_
B-V)
N
_
a
N
_
d
}{
\varepsilon
(N
_
a
+
N
_
d)
}}
\end{align}
In the case of a strongly doped
$
p
^
+
n
$
junction,
we can approximate the SCR since it exists only in the lesser doped region.
\begin{equation}
x
_
n(V)=x
_{
n0
}
\sqrt
{
a
-
\frac
{
V
}{
\phi
_
B
}}
x
_
n(V)=x
_{
n0
}
\sqrt
{
1
-
\frac
{
V
}{
\phi
_
B
}}
\end{equation}
...
...
@@ -55,7 +55,7 @@ In reverse bias, the PN junction acts as a capacitor.
So as a function of the bias voltage, we get
\begin{equation}
\begin{split}
C
_
j(V)
&
=
\frac
{
\varepsilon
}{
x
_
c
(V)
}
\\
C
_
j(V)
&
=
\frac
{
\varepsilon
}{
x
_
d
(V)
}
\\
&
=
\sqrt
{
\frac
{
q
\varepsilon
N
_
aN
_
d
}{
2q(
\phi
_
B-V)(N
_
a+N
_
d)
}}
\\
&
=
\frac
{
C
_{
j0
}}{
\sqrt
{
1-
\frac
{
V
}{
\phi
_
B
}}}
\end{split}
...
...
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